| |
| 2007 | ||
|---|---|---|
| 2 | EE | M. Spraul, W. Nüchter, A. Möller, B. Wunderle, B. Michel: Reliability of SnPb and Pb-free flip-chips under different test conditions. Microelectronics Reliability 47(2-3): 252-258 (2007) |
| 2006 | ||
| 1 | EE | B. Wunderle, B. Michel: Progress in reliability research in the micro and nano region. Microelectronics Reliability 46(9-11): 1685-1694 (2006) |
| 1 | B. Michel | [1] [2] |
| 2 | A. Möller | [2] |
| 3 | W. Nüchter | [2] |
| 4 | M. Spraul | [2] |