| |
| 2007 | ||
|---|---|---|
| 3 | EE | M. Spraul, W. Nüchter, A. Möller, B. Wunderle, B. Michel: Reliability of SnPb and Pb-free flip-chips under different test conditions. Microelectronics Reliability 47(2-3): 252-258 (2007) |
| 2006 | ||
| 2 | EE | B. Wunderle, B. Michel: Progress in reliability research in the micro and nano region. Microelectronics Reliability 46(9-11): 1685-1694 (2006) |
| 2002 | ||
| 1 | EE | Jean-Pierre Bruandet, Françoise Peyrin, Jean-Marc Dinten, B. Michel: 3D tomographic reconstruction of binary images from cone beam projections: a fast level set approach. ISBI 2002: 677-680 |
| 1 | Jean-Pierre Bruandet | [1] |
| 2 | Jean-Marc Dinten | [1] |
| 3 | A. Möller | [3] |
| 4 | W. Nüchter | [3] |
| 5 | Françoise Peyrin | [1] |
| 6 | M. Spraul | [3] |
| 7 | B. Wunderle | [2] [3] |