H. P. Wu

2004
1	EE	P. T. Lai, J. P. Xu, H. P. Wu, C. L. Chan: Interfacial properties and reliability of SiO2 grown on 6H-SiC in dry O2 plus trichloroethylene. Microelectronics Reliability 44(4): 577-580 (2004)

Coauthor Index

1	C. L. Chan	[1]
2	P. T. Lai	[1]
3	J. P. Xu	[1]