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1993 | ||
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1 | Yifan Guo, Chun K. Lim, William T. Chen, Charles G. Woychik: Solder Ball Connect (SBC) assemblies under thermal loading: I. Deformation measurement via moiré interferometry, and its interpretation. IBM Journal of Research and Development 37(5): 635-648 (1993) |
1 | William T. Chen | [1] |
2 | Yifan Guo | [1] |
3 | Chun K. Lim | [1] |