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Art Witulski

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2007
2EERiaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski: Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. ACM Great Lakes Symposium on VLSI 2007: 227-230
1EERiaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski: Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882

Coauthor Index

1Younes Boulghassoul [1] [2]
2Sandeepan DasGupta [1] [2]
3Jeff Draper [1] [2]
4Riaz Naseer [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)