| |
| 2007 | ||
|---|---|---|
| 3 | EE | Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski: Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. ACM Great Lakes Symposium on VLSI 2007: 227-230 |
| 2 | EE | Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski: Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882 |
| 2006 | ||
| 1 | EE | Riaz Naseer, Jeff Draper: DF-DICE: a scalable solution for soft error tolerant circuit design. ISCAS 2006 |
| 1 | Younes Boulghassoul | [2] [3] |
| 2 | Sandeepan DasGupta | [2] [3] |
| 3 | Jeff Draper | [1] [2] [3] |
| 4 | Art Witulski | [2] [3] |