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Sverre Wichlund

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2008
3EESverre Wichlund, Frank Berntsen, Einar J. Aas: Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing 24(1-3): 235-246 (2008)
2006
2EESverre Wichlund, Frank Berntsen, Einar J. Aas: Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. DFT 2006: 119-127
1998
1EESverre Wichlund: On multilevel circuit partitioning. ICCAD 1998: 505-511

Coauthor Index

1Einar J. Aas [2] [3]
2Frank Berntsen [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)