2008 | ||
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3 | EE | Sverre Wichlund, Frank Berntsen, Einar J. Aas: Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing 24(1-3): 235-246 (2008) |
2006 | ||
2 | EE | Sverre Wichlund, Frank Berntsen, Einar J. Aas: Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. DFT 2006: 119-127 |
1998 | ||
1 | EE | Sverre Wichlund: On multilevel circuit partitioning. ICCAD 1998: 505-511 |
1 | Einar J. Aas | [2] [3] |
2 | Frank Berntsen | [2] [3] |