| |
| 2008 | ||
|---|---|---|
| 2 | EE | Sverre Wichlund, Frank Berntsen, Einar J. Aas: Scan Test Response Compaction Combined with Diagnosis Capabilities. J. Electronic Testing 24(1-3): 235-246 (2008) |
| 2006 | ||
| 1 | EE | Sverre Wichlund, Frank Berntsen, Einar J. Aas: Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor. DFT 2006: 119-127 |
| 1 | Einar J. Aas | [1] [2] |
| 2 | Sverre Wichlund | [1] [2] |