| |
| 2005 | ||
|---|---|---|
| 3 | EE | Yun-Che Wen: A BIST Scheme for Testing Analog-to-Digital Converters with Digital Response Analyses. VTS 2005: 383-388 |
| 2001 | ||
| 2 | EE | Yun-Che Wen, Kuen-Jong Lee: Analysis and generation of control and observation structures foranalog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 165-171 (2001) |
| 2000 | ||
| 1 | EE | Yun-Che Wen, Kuen-Jong Lee: An on Chip ADC Test Structure. DATE 2000: 221-225 |
| 1 | Kuen-Jong Lee | [1] [2] |