2005 |
12 | EE | Piyanuch Silapachote,
Allen R. Hanson,
Richard S. Weiss:
A Hierarchical Approach to Sign Recognition.
WACV/MOTION 2005: 22-28 |
2004 |
11 | EE | Nikil Mehta,
Brian Singer,
R. Iris Bahar,
Michael Leuchtenburg,
Richard S. Weiss:
Fetch Halting on Critical Load Misses.
ICCD 2004: 244-249 |
2003 |
10 | EE | Eric Chi,
A. Michael Salem,
R. Iris Bahar,
Richard S. Weiss:
Combining Software and Hardware Monitoring for Improved Power and Performance Tuning.
Interaction between Compilers and Computer Architectures 2003: 57-64 |
2000 |
9 | EE | Sing Bing Kang,
Richard S. Weiss:
Can We Calibrate a Camera Using an Image of a Flat, Textureless Lambertian Surface?
ECCV (2) 2000: 640-653 |
1999 |
8 | EE | Sing Bing Kang,
Richard S. Weiss:
Characterization of Errors in Compositing Panoramic Images.
Computer Vision and Image Understanding 73(2): 269-280 (1999) |
1997 |
7 | EE | Sing Bing Kang,
Richard S. Weiss:
Characterization of errors in compositing panoramic images.
CVPR 1997: 103-109 |
6 | EE | Zhongfei Zhang,
Richard S. Weiss,
Allen R. Hanson:
Obstacle Detection Based on Qualitative and Quantitative 3D Reconstruction.
IEEE Trans. Pattern Anal. Mach. Intell. 19(1): 15-26 (1997) |
1995 |
5 | EE | Peter J. Giblin,
Richard S. Weiss:
Epipolar curves on surfaces.
Image Vision Comput. 13(1): 33-44 (1995) |
1994 |
4 | | Peter J. Giblin,
Richard S. Weiss:
Epipolar Fields on Surfaces.
ECCV (1) 1994: 14-23 |
3 | | Richard S. Weiss:
The Epipolar Parametrization.
Object Representation in Computer Vision 1994: 101-107 |
1993 |
2 | EE | J. Brian Burns,
Richard S. Weiss,
Edward M. Riseman:
View Variation of Point-Set and Line-Segment Features.
IEEE Trans. Pattern Anal. Mach. Intell. 15(1): 51-68 (1993) |
1990 |
1 | EE | Richard S. Weiss,
Hiromasa Nakatani,
Edward M. Riseman:
An Error Analysis for Surface Orientation from Vanishing Points.
IEEE Trans. Pattern Anal. Mach. Intell. 12(12): 1179-1185 (1990) |