| 2008 |
| 42 | EE | Audris Mockus,
David M. Weiss:
Interval quality: relating customer-perceived quality to process quality.
ICSE 2008: 723-732 |
| 41 | EE | David M. Weiss,
J. Jenny Li,
J. Hamilton Slye,
Trung T. Dinh-Trong,
Hongyu Sun:
Decision-Model-Based Code Generation for SPLE.
SPLC 2008: 129-138 |
| 40 | EE | David M. Weiss:
The Product Line Hall of Fame.
SPLC 2008: 395 |
| 2007 |
| 39 | EE | Xiao Ma,
J. Jenny Li,
David M. Weiss:
Prioritized Constraints with Data Sampling Scores for Automatic Test Data Generation.
SNPD (3) 2007: 1129-1134 |
| 38 | | J. Jenny Li,
Birgit Geppert,
Frank Rößler,
David M. Weiss:
Reuse Execution Traces to Reduce Testing of Product Lines.
SPLC (2) 2007: 65-72 |
| 37 | | J. Jenny Li,
David M. Weiss,
J. Hamilton Slye:
Automatic Integration Test Generation from Unit Tests of eXVantage Product Family.
SPLC (2) 2007: 73-80 |
| 2006 |
| 36 | | David M. Weiss,
Paul C. Clements,
Kyo Kang,
Charles W. Krueger:
Software Product Line Hall of Fame.
SPLC 2006: 237 |
| 35 | EE | J. Jenny Li,
David M. Weiss,
Howell Yee:
Code-coverage guided prioritized test generation.
Information & Software Technology 48(12): 1187-1198 (2006) |
| 2005 |
| 34 | | David M. Weiss:
Software Product Line Engineering.
SEKE 2005: 11 |
| 33 | | J. Jenny Li,
W. Eric Wong,
Xiao Ma,
David M. Weiss:
A Constraint Solver for Code-based Test Data Generation.
SEKE 2005: 300-305 |
| 32 | EE | David M. Weiss:
Next Generation Software Product Line Engineering.
SPLC 2005: 1 |
| 31 | EE | Joseph F. Maranzano,
Sandra A. Rozsypal,
Gus H. Zimmerman,
Guy W. Warnken,
Patricia E. Wirth,
David M. Weiss:
Architecture Reviews: Practice and Experience.
IEEE Software 22(2): 34-43 (2005) |
| 2004 |
| 30 | EE | Birgit Geppert,
J. Jenny Li,
Frank Rößler,
David M. Weiss:
Towards Generating Acceptance Tests for Product Lines.
ICSR 2004: 35-48 |
| 29 | EE | John Klein,
Deborah Hill,
David M. Weiss:
Industrial-Strength Software Product Line Engineering.
SPLC 2004: 311 |
| 28 | EE | David M. Weiss:
Desert Island Column: Saving Software Engineering.
Autom. Softw. Eng. 11(3): 323-326 (2004) |
| 2003 |
| 27 | EE | Audris Mockus,
David M. Weiss,
Ping Zhang:
Understanding and Predicting Effort in Software Projects.
ICSE 2003: 274-284 |
| 26 | EE | John Klein,
Barry Price,
David M. Weiss:
Industrial-Strength Software Product-Line Engineering.
ICSE 2003: 751-752 |
| 25 | EE | Birgit Geppert,
David M. Weiss:
Goal-Oriented Assessment of Product-Line Domains.
IEEE METRICS 2003: 180-188 |
| 2002 |
| 24 | EE | David M. Weiss,
David Bennett,
John Y. Payseur,
Patrick Tendick,
Ping Zhang:
Goal-oriented software assessment.
ICSE 2002: 221-231 |
| 23 | EE | Günter Böckle,
Jesús Bermejo Muñoz,
Peter Knauber,
Charles W. Krueger,
Julio Cesar Sampaio do Prado Leite,
Frank van der Linden,
Linda M. Northrop,
Michael Stark,
David M. Weiss:
Adopting and Institutionalizing a Product Line Culture.
SPLC 2002: 49-59 |
| 2001 |
| 22 | | Daniel Hoffman,
David M. Weiss:
David L. Parnas Symposium.
ICSE 2001: 807-809 |
| 21 | EE | Peter Knauber,
Jesús Bermejo Muñoz,
Günter Böckle,
Julio Cesar Sampaio do Prado Leite,
Frank van der Linden,
Linda M. Northrop,
Michael Stark,
David M. Weiss:
Quantifying Product Line Benefits.
PFE 2001: 155-163 |
| 20 | EE | Audris Mockus,
David M. Weiss:
Globalization by Chunking: A Quantitative Approach.
IEEE Software 18(2): (2001) |
| 2000 |
| 19 | EE | David M. Weiss:
Product Family Techniques Session.
IW-SAPF 2000: 184-186 |
| 18 | EE | Audris Mockus,
David M. Weiss:
Predicting risk of software changes.
Bell Labs Technical Journal 5(2): 169-180 (2000) |
| 17 | EE | Betty H. C. Cheng,
David M. Weiss:
Guest Editors' Introduction: Requirements Engineering - Integrating Technology.
IEEE Software 17(3): (2000) |
| 16 | | Mark A. Ardis,
Nigel Daley,
Daniel Hoffman,
Harvey P. Siy,
David M. Weiss:
Software product lines: a case study.
Softw., Pract. Exper. 30(7): 825-847 (2000) |
| 1998 |
| 15 | EE | David M. Weiss,
Frank van der Linden:
Development Process.
ESPRIT ARES Workshop 1998: 170-171 |
| 14 | EE | David M. Weiss:
Commonality Analysis: A Systematic Process for Defining Families.
ESPRIT ARES Workshop 1998: 214-222 |
| 13 | EE | James Coplien,
Daniel Hoffman,
David M. Weiss:
Commonality and Variability in Software Engineering.
IEEE Software 15(6): 37-45 (1998) |
| 1997 |
| 12 | EE | Mark A. Ardis,
David M. Weiss:
Defining Families: The Commonality Analysis (Tutorial).
ICSE 1997: 649-650 |
| 11 | EE | Neeraj K. Gupta,
Lalita Jategaonkar Jagadeesan,
Eleftherios Koutsofios,
David M. Weiss:
Auditdraw: Generating Audits the FAST Way.
RE 1997: 188-197 |
| 1987 |
| 10 | | David M. Weiss:
Teaching a Software Design Methodology.
IEEE Trans. Software Eng. 13(11): 1156-1163 (1987) |
| 9 | EE | David Lorge Parnas,
David M. Weiss:
Active design reviews: Principles and practices.
Journal of Systems and Software 7(4): 259-265 (1987) |
| 1985 |
| 8 | | David Lorge Parnas,
David M. Weiss:
Active Design Reviews: Principles and Practices.
ICSE 1985: 132-136 |
| 7 | | David M. Weiss,
Victor R. Basili:
Evaluating Software Development by Analysis of Changes: Some Data from the Software Engineering Laboratory.
IEEE Trans. Software Eng. 11(2): 157-168 (1985) |
| 6 | | David Lorge Parnas,
Paul C. Clements,
David M. Weiss:
The Modular Structure of Complex Systems.
IEEE Trans. Software Eng. 11(3): 259-266 (1985) |
| 1984 |
| 5 | | David Lorge Parnas,
Paul C. Clements,
David M. Weiss:
The Modular Structure of Complex Systems.
ICSE 1984: 408-419 |
| 4 | | Victor R. Basili,
David M. Weiss:
A Methodology for Collecting Valid Software Engineering Data.
IEEE Trans. Software Eng. 10(6): 728-738 (1984) |
| 1981 |
| 3 | | Victor R. Basili,
David M. Weiss:
Evaluation of a Software Requirements Document by Analysis of Change Data.
ICSE 1981: 314-324 |
| 1979 |
| 2 | EE | David M. Weiss:
Evaluating software development by error analysis: The data from the Architecture Research Facility.
Journal of Systems and Software 1: 57-70 (1979) |
| 1976 |
| 1 | EE | David Lorge Parnas,
John E. Shore,
David M. Weiss:
Abstract Types Defined as Classes of Variables.
Conference on Data: Abstraction, Definition and Structure 1976: 149-153 |