Tahui Wang

2005
2	EE	M. H. Lin, Y. L. Lin, K. P. Chang, K. C. Su, Tahui Wang: Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment. Microelectronics Reliability 45(7-8): 1061-1078 (2005)
1993
1	EE	Tahui Wang, Sheng-Jyh Wu, Chimoon Huang: Device and circuit simulation of anomalous DX trap effects in DCFL and SCFL HEMT inverters. IEEE Trans. on CAD of Integrated Circuits and Systems 12(11): 1758-1761 (1993)

Coauthor Index

1	K. P. Chang	[2]
2	Chimoon Huang	[1]
3	M. H. Lin	[2]
4	Y. L. Lin	[2]
5	K. C. Su	[2]
6	Sheng-Jyh Wu	[1]

Colors in the list of coauthors