K. H. Wang

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2002

1 EE W. L. Pearn, C. H. Ko, K. H. Wang: A multiprocess performance analysis chart based on the incapability index C_pp: an application to the chip resistors. Microelectronics Reliability 42(7): 1121-1125 (2002)

2002
1	EE	W. L. Pearn, C. H. Ko, K. H. Wang: A multiprocess performance analysis chart based on the incapability index C_pp: an application to the chip resistors. Microelectronics Reliability 42(7): 1121-1125 (2002)

Coauthor Index

1 C. H. Ko [1]

2 W. L. Pearn [1]