C. H. Ko
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2002
1
EE
W. L. Pearn
, C. H. Ko,
K. H. Wang
: A multiprocess performance analysis chart based on the incapability index C
pp
: an application to the chip resistors.
Microelectronics Reliability 42
(7): 1121-1125 (2002)
Coauthor
Index
1
W. L. Pearn
[
1
]
2
K. H. Wang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)