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C. H. Ko

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2002
1EEW. L. Pearn, C. H. Ko, K. H. Wang: A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors. Microelectronics Reliability 42(7): 1121-1125 (2002)

Coauthor Index

1W. L. Pearn [1]
2K. H. Wang [1]

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