| 2009 |
|---|
| 15 | EE | W. L. Pearn,
H. N. Hung,
Ya Ching Cheng:
Supplier selection for one-sided processes with unequal sample sizes.
European Journal of Operational Research 195(2): 381-393 (2009) |
| 2008 |
|---|
| 14 | EE | Chien-Wei Wu,
W. L. Pearn:
A variables sampling plan based on C.
European Journal of Operational Research 184(2): 549-560 (2008) |
| 13 | EE | Ya-Chen Hsu,
W. L. Pearn,
Pei-Ching Wu:
Capability adjustment for gamma processes with mean shift consideration in implementing Six Sigma program.
European Journal of Operational Research 191(2): 517-529 (2008) |
| 2007 |
|---|
| 12 | EE | W. L. Pearn,
Ya-Chen Hsu:
Optimal tool replacement for processes with low fraction defective.
European Journal of Operational Research 180(3): 1116-1129 (2007) |
| 2006 |
|---|
| 11 | EE | W. L. Pearn,
Chien-Wei Wu:
Production quality and yield assurance for processes with multiple independent characteristics.
European Journal of Operational Research 173(2): 637-647 (2006) |
| 10 | EE | W. L. Pearn,
Y. C. Chang,
Chien-Wei Wu:
Multiple-process performance analysis chart based on process loss indices.
Int. J. Systems Science 37(7): 429-435 (2006) |
| 2005 |
|---|
| 9 | EE | W. L. Pearn,
Chien-Wei Wu:
A Bayesian approach for assessing process precision based on multiple samples.
European Journal of Operational Research 165(3): 685-695 (2005) |
| 8 | EE | W. L. Pearn,
W. C. Chiu:
Approximate solutions for the maximum benefit chinese postman problem.
Int. J. Systems Science 36(13): 815-822 (2005) |
| 2003 |
|---|
| 7 | EE | W. L. Pearn,
Ming-Hung Shu:
An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators.
Microelectronics Reliability 43(3): 495-502 (2003) |
| 6 | EE | W. L. Pearn,
G. H. Lin:
A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples.
Microelectronics Reliability 43(4): 651-664 (2003) |
| 5 | EE | W. L. Pearn,
Ming-Hung Shu:
Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC.
Microelectronics Reliability 43(6): 963-975 (2003) |
| 4 | EE | W. L. Pearn,
Ming-Hung Shu:
Erratum to "An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators" [Microelectronics Reliability 2003;43: 495-502].
Microelectronics Reliability 43(8): 1349 (2003) |
| 2002 |
|---|
| 3 | EE | P. C. Lin,
W. L. Pearn:
Testing process capability for one-sided specification limit with application to the voltage level translator.
Microelectronics Reliability 42(12): 1975-1983 (2002) |
| 2 | EE | W. L. Pearn,
C. H. Ko,
K. H. Wang:
A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors.
Microelectronics Reliability 42(7): 1121-1125 (2002) |
| 1 | EE | Jann-Pygn Chen,
W. L. Pearn:
Testing process performance based on the yield: an application to the liquid-crystal display module.
Microelectronics Reliability 42(8): 1235-1241 (2002) |
