| |
| 1997 | ||
|---|---|---|
| 3 | Cheng-Ping Wang, Chin-Long Wey: Development of Hierarchical Testability Design Methodologies for Analog/Mixed-Signal Integrated Circuits. ICCD 1997: 468-473 | |
| 1996 | ||
| 2 | EE | Cheng-Ping Wang, Chin-Long Wey: Test Generation Of Analog Switched-Current Circuits. Asian Test Symposium 1996: 276-281 |
| 1995 | ||
| 1 | EE | Chin-Long Wey, Haiyan Wang, Cheng-Ping Wang: A self-timed redundant-binary number to binary number converter for digital arithmetic processors. ICCD 1995: 386- |
| 1 | Haiyan Wang | [1] |
| 2 | Chin-Long Wey | [1] [2] [3] |