S. Wakana

1997
2	EE	K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System for Quarter-micron VLSI Circuits. Asian Test Symposium 1997: 208-213
1996
1		K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. ITC 1996: 269-275

Coauthor Index

1	Y. Goto	[1] [2]
2	J. Matsumoto	[1] [2]
3	K. Ozaki	[1] [2]
4	H. Sekiguchi	[1] [2]
5	Y. Umehara	[1] [2]