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S. Wakana

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1997
2EEK. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System for Quarter-micron VLSI Circuits. Asian Test Symposium 1997: 208-213
1996
1 K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. ITC 1996: 269-275

Coauthor Index

1Y. Goto [1] [2]
2J. Matsumoto [1] [2]
3K. Ozaki [1] [2]
4H. Sekiguchi [1] [2]
5Y. Umehara [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)