| |
| 1997 | ||
|---|---|---|
| 2 | EE | K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System for Quarter-micron VLSI Circuits. Asian Test Symposium 1997: 208-213 |
| 1996 | ||
| 1 | K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. ITC 1996: 269-275 | |
| 1 | Y. Goto | [1] [2] |
| 2 | J. Matsumoto | [1] [2] |
| 3 | K. Ozaki | [1] [2] |
| 4 | Y. Umehara | [1] [2] |
| 5 | S. Wakana | [1] [2] |