| |
| 2003 | ||
|---|---|---|
| 2 | EE | Massimo Conti, Paolo Crippa, Francesco Fedecostunte, Simone Orcioni, F. Ricciardi, Claudio Turchetti, Loris Vendrame: A modular test structure for CMOS mismatch characterization. ISCAS (5) 2003: 569-572 |
| 2002 | ||
| 1 | EE | Massimo Conti, Paolo Crippa, Simone Orcioni, M. Pesare, Claudio Turchetti, Loris Vendrame, S. Lucherini: A new methodology for the statistical analysis of VLSI CMOS circuits and its application to flash memories. ISCAS (5) 2002: 89-92 |
| 1 | Massimo Conti | [1] [2] |
| 2 | Paolo Crippa | [1] [2] |
| 3 | Francesco Fedecostunte | [2] |
| 4 | S. Lucherini | [1] |
| 5 | Simone Orcioni | [1] [2] |
| 6 | M. Pesare | [1] |
| 7 | F. Ricciardi | [2] |
| 8 | Claudio Turchetti | [1] [2] |