| |
| 2003 | ||
|---|---|---|
| 1 | EE | Massimo Conti, Paolo Crippa, Francesco Fedecostunte, Simone Orcioni, F. Ricciardi, Claudio Turchetti, Loris Vendrame: A modular test structure for CMOS mismatch characterization. ISCAS (5) 2003: 569-572 |
| 1 | Massimo Conti | [1] |
| 2 | Paolo Crippa | [1] |
| 3 | Simone Orcioni | [1] |
| 4 | F. Ricciardi | [1] |
| 5 | Claudio Turchetti | [1] |
| 6 | Loris Vendrame | [1] |