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1995 | ||
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1 | EE | Murali M. R. Gala, Don E. Ross, Karan L. Watson, Beena Vasudevan, Peter Utama: Built-in self test for C-testable ILA's. IEEE Trans. on CAD of Integrated Circuits and Systems 14(11): 1388-1398 (1995) |
1 | Murali M. R. Gala | [1] |
2 | Don E. Ross | [1] |
3 | Peter Utama | [1] |
4 | Karan L. Watson | [1] |