| |
| 1995 | ||
|---|---|---|
| 1 | EE | Murali M. R. Gala, Don E. Ross, Karan L. Watson, Beena Vasudevan, Peter Utama: Built-in self test for C-testable ILA's. IEEE Trans. on CAD of Integrated Circuits and Systems 14(11): 1388-1398 (1995) |
| 1 | Don E. Ross | [1] |
| 2 | Peter Utama | [1] |
| 3 | Beena Vasudevan | [1] |
| 4 | Karan L. Watson | [1] |