Josep Rius Vázquez

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2004

2 EE Josep Rius Vázquez, José Pineda de Gyvez: Power Supply Noise Monitor for Signal Integrity Faults. DATE 2004: 1406-1407

1 EE Josep Rius Vázquez, José Pineda de Gyvez: Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs. VTS 2004: 53-58

2004
2	EE	Josep Rius Vázquez, José Pineda de Gyvez: Power Supply Noise Monitor for Signal Integrity Faults. DATE 2004: 1406-1407
1	EE	Josep Rius Vázquez, José Pineda de Gyvez: Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs. VTS 2004: 53-58

Coauthor Index

1 José Pineda de Gyvez [1] [2]