| |
| 1997 | ||
|---|---|---|
| 1 | EE | Kazumi Hatayama, Mitsuji Ikeda, Masahiro Takakura, Satoshi Uchiyama, Yoriyuki Sakamoto: Application of a Design for Delay Testability Approach to High Speed Logic LSIs. Asian Test Symposium 1997: 112-115 |
| 1 | Kazumi Hatayama | [1] |
| 2 | Mitsuji Ikeda | [1] |
| 3 | Yoriyuki Sakamoto | [1] |
| 4 | Masahiro Takakura | [1] |