K. N. Tu

2006
1	EE	M. Y. Yan, K. N. Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy: A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. Microelectronics Reliability 46(8): 1392-1395 (2006)

Coauthor Index

1	Ahila Krishnamoorthy	[1]
2	S. G. Mhaisalkar	[1]
3	A. V. Vairagar	[1]
4	M. Y. Yan	[1]