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K. N. Tu

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2006
1EEM. Y. Yan, K. N. Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy: A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. Microelectronics Reliability 46(8): 1392-1395 (2006)

Coauthor Index

1Ahila Krishnamoorthy [1]
2S. G. Mhaisalkar [1]
3A. V. Vairagar [1]
4M. Y. Yan [1]

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