1996 | ||
---|---|---|
3 | EE | Yuan-Tzu Ting, Li Wei Chao, Wei Chung Chao: A Practical Implementation Of Dynamic Testing Of An Ad Converter. Asian Test Symposium 1996: 238-243 |
2 | EE | Chauchin Su, Shyh-Shen Hwang, Shyh-Jye Jou, Yuan-Tzu Ting: Syndrome Simulation And Syndrome Test For Unscanned Interconnects. Asian Test Symposium 1996: 62-67 |
1 | EE | Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tzu Ting: Metrology for analog module testing using analog testability bus. ICCAD 1996: 594-599 |
1 | Li Wei Chao | [3] |
2 | Wei Chung Chao | [3] |
3 | Yue-Tsang Chen | [1] |
4 | Shyh-Shen Hwang | [2] |
5 | Shyh-Jye Jou | [1] [2] |
6 | Chauchin Su | [1] [2] |