2007 |
33 | EE | Michael F. Siok,
Jeff Tian:
Empirical Study of Embedded Software Quality and Productivity.
HASE 2007: 313-320 |
32 | EE | Nasser Alaeddine,
Jeff Tian:
Analytic Model for Web Anomalies Classification.
HASE 2007: 395-396 |
31 | EE | Li Ma,
Jeff Tian:
Web error classification and analysis for reliability improvement.
Journal of Systems and Software 80(6): 795-804 (2007) |
2006 |
30 | | Jeff Tian,
Li Ma:
Web Testing for Reliability Improvement.
Advances in Computers 67: 178-225 (2006) |
2005 |
29 | EE | Akif Günes Koru,
Jeff Tian:
Comparing High-Change Modules and Modules with the Highest Measurement Values in Two Large-Scale Open-Source Products.
IEEE Trans. Software Eng. 31(8): 625-642 (2005) |
2004 |
28 | EE | Jeff Tian:
Quality-Evaluation Models and Measurements.
IEEE Software 21(3): 84-91 (2004) |
27 | EE | Akif Günes Koru,
Jeff Tian:
Defect Handling in Medium and Large Open Source Projects.
IEEE Software 21(4): 54-61 (2004) |
26 | EE | Jeff Tian,
Sunita Rudraraju,
Zhao Li:
Evaluating Web Software Reliability Based on Workload and Failure Data Extracted from Server Logs.
IEEE Trans. Software Eng. 30(11): 754-769 (2004) |
2003 |
25 | EE | Zhao Li,
Jeff Tian:
Testing the Suitability of Markov Chains as Web Usage Models.
COMPSAC 2003: 356-361 |
24 | EE | Jeff Tian,
Li Ma,
Zhao Li,
Akif Günes Koru:
A Hierarchical Strategy for Testing Web-Based Applications and Ensuring Their Reliability.
COMPSAC 2003: 702- |
23 | EE | Li Ma,
Jeff Tian:
Analyzing Errors and Referral Pairs to Characterize Common Problems and Improve Web Reliability.
ICWE 2003: 314-323 |
22 | EE | Akif Günes Koru,
Jeff Tian:
An empirical comparison and characterization of high defect and high complexity modules.
Journal of Systems and Software 67(3): 153-163 (2003) |
2002 |
21 | EE | Jeff Tian:
Better Reliability Assessment and Prediction through Data Clustering.
IEEE Trans. Software Eng. 28(10): 997-1007 (2002) |
2001 |
20 | EE | Chaitanya Kallepalli,
Jeff Tian:
Usage Measurement for Statistical Web Testing and Reliability Analysis.
IEEE METRICS 2001: 148-158 |
19 | EE | Chaitanya Kallepalli,
Jeff Tian:
Measuring and Modeling Usage and Reliability for Statistical Web Testing.
IEEE Trans. Software Eng. 27(11): 1023-1036 (2001) |
18 | EE | Jeff Tian,
Anthony Nguyen,
Curt Allen,
Ravi Appan:
Experience with identifying and characterizing problem-prone modules in telecommunication software systems.
Journal of Systems and Software 57(3): 207-215 (2001) |
2000 |
17 | | Mahesh Deshpande,
Frank P. Coyle,
Jeff Tian:
Improving the Reliability of Object-Oriented Software through Object-Level Behavioral Simulation.
Ada-Europe 2000: 266-279 |
1999 |
16 | EE | Jeff Tian:
Measurement and continuous improvement of software reliability throughout software life-cycle.
Journal of Systems and Software 47(2-3): 189-195 (1999) |
1998 |
15 | EE | Jeff Tian:
Early Measurement and Improvement of Software Quality.
COMPSAC 1998: 196-203 |
14 | | Jeff Tian:
Reliability Measurement, Analysis, and Improvement for Large Software Systems.
Advances in Computers 46: 160-237 (1998) |
13 | EE | Jeff Tian,
Joe Palma:
Analyzing and Improving Reliability: A Tree-Based Approach.
IEEE Software 15(2): 97-104 (1998) |
12 | EE | Jeff Tian,
Joel Troster:
A comparison of measurement and defect characteristics of new and legacy software systems.
Journal of Systems and Software 44(2): 135-146 (1998) |
1997 |
11 | | Jeff Tian,
Joe Palma:
Test Workload Measurement and Reliability Analysis for Large Commercial Software Systems.
Ann. Software Eng. 4: 201-222 (1997) |
10 | EE | Jeff Tian,
Joel Troster,
Joe Palma:
Tool support for software measurement, analysis and improvement.
Journal of Systems and Software 39(2): 165-178 (1997) |
1996 |
9 | | Jeff Tian:
An Integrated Approach to Test Tracking and Analysis.
Journal of Systems and Software 35(2): 127-140 (1996) |
1995 |
8 | | Joel Troster,
Jeff Tian:
Measurement and Defect Modeling for a Legacy Software System.
Ann. Software Eng. 1: 95-118 (1995) |
7 | EE | Jeff Tian:
Integrating Time Domain and Input Domain Analyses of Software Reliability Using Tree-Based Models.
IEEE Trans. Software Eng. 21(12): 945-958 (1995) |
6 | EE | Jeff Tian,
Peng Lu,
Joe Palma:
Test-Execution-Based Reliability Measurement and Modeling for Large Commercial Software.
IEEE Trans. Software Eng. 21(5): 405-414 (1995) |
5 | EE | Jeff Tian,
Marvin V. Zelkowitz:
Complexity Measure Evaluation and Selection.
IEEE Trans. Software Eng. 21(8): 641-650 (1995) |
1994 |
4 | | Marvin V. Zelkowitz,
Jianhui Tian:
Measuring Prime Program Complexity.
Inf. Sci. 77(3-4): 325-350 (1994) |
1993 |
3 | EE | Joe Palma,
Jeff Tian,
Peng Lu:
Collecting data for software reliability analysis and modeling.
CASCON 1993: 483-494 |
1992 |
2 | EE | Jianhui Tian,
Marvin V. Zelkowitz:
A formal program complexity model and its application.
Journal of Systems and Software 17(3): 253-266 (1992) |
1 | EE | Sergio R. Cárdenas,
Jianhui Tian,
Marvin V. Zelkowitz:
An application of decision theory for the evaluation of software prototypes.
Journal of Systems and Software 19(1): 27-39 (1992) |