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Uwe Thiemann

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2005
1EEPeter Jacob, Uwe Thiemann, Joachim C. Reiner: Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectronics Reliability 45(7-8): 1174-1180 (2005)

Coauthor Index

1Peter Jacob [1]
2Joachim C. Reiner [1]

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