Peter Jacob

List of publications from the DBLP Bibliography Server - FAQ

2005

1 EE Peter Jacob, Uwe Thiemann, Joachim C. Reiner: Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectronics Reliability 45(7-8): 1174-1180 (2005)

2005
1	EE	Peter Jacob, Uwe Thiemann, Joachim C. Reiner: Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectronics Reliability 45(7-8): 1174-1180 (2005)

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