Pee Ya Tan

List of publications from the DBLP Bibliography Server - FAQ

2003

1 EE Sherry Suat Cheng Khoo, Pee Ya Tan, Steven H. Voldman: Microanalysis and electromigration reliability performance of high current transmission line pulse (TLP) stressed copper interconnects. Microelectronics Reliability 43(7): 1039-1045 (2003)

2003
1	EE	Sherry Suat Cheng Khoo, Pee Ya Tan, Steven H. Voldman: Microanalysis and electromigration reliability performance of high current transmission line pulse (TLP) stressed copper interconnects. Microelectronics Reliability 43(7): 1039-1045 (2003)

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