| |
| 2004 | ||
|---|---|---|
| 2 | EE | Hideaki Matsuzaki, Hiroki Sugiyama, Haruki Yokoyama, Takashi Kobayashi, Takatomo Enoki: Suppression of short-channel effect in pseudomorphic In0.25Al0.75P/In0.75Ga0.25As high electron mobility transistors. IEICE Electronic Express 1(11): 292-297 (2004) |
| 2002 | ||
| 1 | EE | Tetsuya Suemitsu, Yoshino K. Fukai, Hiroki Sugiyama, Kazuo Watanabe, Haruki Yokoyama: Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs. Microelectronics Reliability 42(1): 47-52 (2002) |
| 1 | Takatomo Enoki | [2] |
| 2 | Yoshino K. Fukai | [1] |
| 3 | Takashi Kobayashi | [2] |
| 4 | Hideaki Matsuzaki | [2] |
| 5 | Tetsuya Suemitsu | [1] |
| 6 | Kazuo Watanabe | [1] |
| 7 | Haruki Yokoyama | [1] [2] |