| |
| 2002 | ||
|---|---|---|
| 1 | EE | Tetsuya Suemitsu, Yoshino K. Fukai, Hiroki Sugiyama, Kazuo Watanabe, Haruki Yokoyama: Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs. Microelectronics Reliability 42(1): 47-52 (2002) |
| 1 | Tetsuya Suemitsu | [1] |
| 2 | Hiroki Sugiyama | [1] |
| 3 | Kazuo Watanabe | [1] |
| 4 | Haruki Yokoyama | [1] |