| |
| 2006 | ||
|---|---|---|
| 2 | EE | A. Irace, G. Breglio, P. Spirito, A. Bricconi, D. Raffo, L. Merlin: Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. Microelectronics Reliability 46(9-11): 1784-1789 (2006) |
| 2005 | ||
| 1 | EE | A. Irace, G. Breglio, P. Spirito, Romeo Letor, Sebastiano Russo: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability 45(9-11): 1706-1710 (2005) |
| 1 | G. Breglio | [1] [2] |
| 2 | A. Bricconi | [2] |
| 3 | A. Irace | [1] [2] |
| 4 | Romeo Letor | [1] |
| 5 | L. Merlin | [2] |
| 6 | D. Raffo | [2] |
| 7 | Sebastiano Russo | [1] |