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P. Spirito

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2006
2EEA. Irace, G. Breglio, P. Spirito, A. Bricconi, D. Raffo, L. Merlin: Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. Microelectronics Reliability 46(9-11): 1784-1789 (2006)
2005
1EEA. Irace, G. Breglio, P. Spirito, Romeo Letor, Sebastiano Russo: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability 45(9-11): 1706-1710 (2005)

Coauthor Index

1G. Breglio [1] [2]
2A. Bricconi [2]
3A. Irace [1] [2]
4Romeo Letor [1]
5L. Merlin [2]
6D. Raffo [2]
7Sebastiano Russo [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)