| |
| 2005 | ||
|---|---|---|
| 2 | EE | A. Irace, G. Breglio, P. Spirito, Romeo Letor, Sebastiano Russo: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability 45(9-11): 1706-1710 (2005) |
| 2002 | ||
| 1 | EE | Sebastiano Russo, Romeo Letor, Orazio Viscuso, Lucia Torrisi, Gianluigi Vitali: Fast thermal fatigue on top metal layer of power devices. Microelectronics Reliability 42(9-11): 1617-1622 (2002) |
| 1 | G. Breglio | [2] |
| 2 | A. Irace | [2] |
| 3 | Sebastiano Russo | [1] [2] |
| 4 | P. Spirito | [2] |
| 5 | Lucia Torrisi | [1] |
| 6 | Orazio Viscuso | [1] |
| 7 | Gianluigi Vitali | [1] |