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Piotr R. Sidorowicz

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2002
3EEPiotr R. Sidorowicz, Janusz A. Brzozowski: A framework for testing special-purpose memories. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1459-1468 (2002)
1999
2EEPiotr R. Sidorowicz: Modeling and Testing Transistor Faults in Content-Addressable Memories. MTDT 1999: 83-90
1998
1EEPiotr R. Sidorowicz, Janusz A. Brzozowski: An Approach to Modeling and Testing Memories and Its Application to CAMs. VTS 1998: 411-417

Coauthor Index

1Janusz A. Brzozowski [1] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)