| |
| 2006 | ||
|---|---|---|
| 2 | EE | Zhen Shi, Peter Sandborn: Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. J. Electronic Testing 22(1): 49-60 (2006) |
| 2003 | ||
| 1 | EE | Zhen Shi, Peter Sandborn: Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. ITC 2003: 937-946 |
| 1 | Peter Sandborn | [1] [2] |