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Jun Seomun

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2008
2EEJun Seomun, Jae-Hyun Kim, Youngsoo Shin: Skewed Flip-Flop and Mixed-Vt Gates for Minimizing Leakage in Sequential Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 1956-1968 (2008)
2007
1EEJun Seomun, Jaehyun Kim, Youngsoo Shin: Skewed Flip-Flop Transformation for Minimizing Leakage in Sequential Circuits. DAC 2007: 103-106

Coauthor Index

1Jae-Hyun Kim [2]
2Jaehyun Kim [1]
3Youngsoo Shin [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)