| 2008 |
|---|
| 3 | EE | Siegfried F. Karg,
G. Ingmar Meijer,
J. Georg Bednorz,
Charles T. Rettner,
Alejandro G. Schrott,
Eric A. Joseph,
Chung Hon Lam,
Markus Janousch,
Urs Staub,
Fabio LaMattina,
Santos F. Alvarado,
Daniel Widmer,
Richard Stutz,
Ute Drechsler,
Daniele Caimi:
Transition-metal-oxide-based resistance-change memories.
IBM Journal of Research and Development 52(4-5): 481-492 (2008) |
| 1998 |
|---|
| 2 | EE | Eugene J. O'Sullivan,
Alejandro G. Schrott,
Milan Paunovic,
Carlos J. Sambucetti,
Jeffrey R. Marino,
Philip J. Bailey,
Suryanarayana Kaja,
Krystyna W. Semkow:
Electrolessly deposited diffusion barriers for microelectronics.
IBM Journal of Research and Development 42(5): 607-620 (1998) |
| 1993 |
|---|
| 1 | | Alejandro G. Schrott,
Gerald S. Frankel:
Application of X-ray spectroscopy to the study of electrochemically formed surface oxide films.
IBM Journal of Research and Development 37(2): 191-206 (1993) |
