| |
| 1995 | ||
|---|---|---|
| 3 | Birger Schneider, Soeren Soegaard: IntegraTEST: The New Wave in Mixed-Signal Test. ITC 1995: 750-760 | |
| 1988 | ||
| 2 | Birger Schneider, Peter Oestergaard: An Advanced Data Compaction Approach for Test During Burn-In. ITC 1988: 381-390 | |
| 1986 | ||
| 1 | Birger Schneider, Gert Jørgensen, Mogens B. Christensen: The Effects of Backdrive Stressing Fast IC Technologies. ITC 1986: 452-464 | |
| 1 | Mogens B. Christensen | [1] |
| 2 | Gert Jørgensen | [1] |
| 3 | Peter Oestergaard | [2] |
| 4 | Soeren Soegaard | [3] |