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D. G. Schlom

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2005
1EEGerald Lucovsky, J. G. Hong, C. C. Fulton, N. A. Stoute, Y. Zou, R. J. Nemanich, D. E. Aspnes, H. Ade, D. G. Schlom: Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra. Microelectronics Reliability 45(5-6): 827-830 (2005)

Coauthor Index

1H. Ade [1]
2D. E. Aspnes [1]
3C. C. Fulton [1]
4J. G. Hong [1]
5Gerald Lucovsky [1]
6R. J. Nemanich [1]
7N. A. Stoute [1]
8Y. Zou [1]

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