| |
| 2005 | ||
|---|---|---|
| 2 | EE | Martin Sauter: Determination of self-heating and thermal resistance in polycrystalline and bulk silicon resistors by DC measurements. Microelectronics Reliability 45(7-8): 1187-1193 (2005) |
| 2001 | ||
| 1 | EE | Klaus-Willi Pieper, Martin Sauter: Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. Microelectronics Reliability 41(1): 133-136 (2001) |
| 1 | Klaus-Willi Pieper | [1] |