Klaus-Willi Pieper

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2001

1 EE Klaus-Willi Pieper, Martin Sauter: Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. Microelectronics Reliability 41(1): 133-136 (2001)

2001
1	EE	Klaus-Willi Pieper, Martin Sauter: Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents. Microelectronics Reliability 41(1): 133-136 (2001)

Coauthor Index

1 Martin Sauter [1]