| |
| 2008 | ||
|---|---|---|
| 2 | EE | Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. J. Electronic Testing 24(1-3): 11-19 (2008) |
| 2006 | ||
| 1 | EE | Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Soft Error Masking Circuit and Latch Using Schmitt Trigger Circuit. DFT 2006: 327-335 |
| 1 | Hideo Ito | [1] [2] |
| 2 | Kazuteru Namba | [1] [2] |