F. Saint-Eve
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2007
1
EE
Z. Khatir
,
S. Lefebvre
, F. Saint-Eve: Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices.
Microelectronics Reliability 47
(2-3): 422-428 (2007)
Coauthor
Index
1
Z. Khatir
[
1
]
2
S. Lefebvre
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)