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F. Saint-Eve

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2007
1EEZ. Khatir, S. Lefebvre, F. Saint-Eve: Experimental and numerical investigations on delayed short-circuit failure mode of single chip IGBT devices. Microelectronics Reliability 47(2-3): 422-428 (2007)

Coauthor Index

1Z. Khatir [1]
2S. Lefebvre [1]

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