M. J. Rizvi
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2005
1
EE
M. J. Rizvi,
Y. C. Chan
,
C. Bailey
,
H. Lu
: Study of anisotropic conductive adhesive joint behavior under 3-point bending.
Microelectronics Reliability 45
(3-4): 589-596 (2005)
Coauthor
Index
1
C. Bailey
[
1
]
2
Y. C. Chan
[
1
]
3
H. Lu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
