2008 |
4 | EE | Ashesh Rastogi,
Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
On Composite Leakage Current Maximization.
J. Electronic Testing 24(4): 405-420 (2008) |
2007 |
3 | EE | Ashesh Rastogi,
Wei Chen,
Sandip Kundu:
On Estimating Impact of Loading Effect on Leakage Current in Sub-65nm Scaled CMOS Circuits Based on Newton-Raphson Method.
DAC 2007: 712-715 |
2 | EE | Ashesh Rastogi,
Kunal P. Ganeshpure,
Sandip Kundu:
A Study on Impact of Leakage Current on Dynamic Power.
ISCAS 2007: 1069-1072 |
1 | EE | Ashesh Rastogi,
Wei Chen,
Alodeep Sanyal,
Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect.
VLSI Design 2007: 583-588 |