| 2007 |
|---|
| 5 | EE | Arun Ramakrishnan,
Gurmeet Singh,
Henan Zhao,
Ewa Deelman,
Rizos Sakellariou,
Karan Vahi,
Kent Blackburn,
David Meyers,
Michael Samidi:
Scheduling Data-IntensiveWorkflows onto Storage-Constrained Distributed Resources.
CCGRID 2007: 401-409 |
| 4 | EE | Gurmeet Singh,
Karan Vahi,
Arun Ramakrishnan,
Gaurang Mehta,
Ewa Deelman,
Henan Zhao,
Rizos Sakellariou,
Kent Blackburn,
Duncan Brown,
Stephen Fairhurst,
David Meyers,
G. Bruce Berriman,
John Good,
Daniel S. Katz:
Optimizing workflow data footprint.
Scientific Programming 15(4): 249-268 (2007) |
| 2004 |
|---|
| 3 | EE | Arun Ramakrishnan,
Michael G. Pecht:
Load characterization during transportation.
Microelectronics Reliability 44(2): 333-338 (2004) |
| 2002 |
|---|
| 2 | EE | Srinivasan Parthasarathy,
Arun Ramakrishnan:
Parallel Incremental 2D-Discretization on Dynamic Datasets.
IPDPS 2002 |
| 1 | EE | Michael G. Pecht,
Diganta Das,
Arun Ramakrishnan:
The IEEE standards on reliability program and reliability prediction methods for electronic equipment.
Microelectronics Reliability 42(9-11): 1259-1266 (2002) |
