2008 |
29 | EE | Hossein Ragheb,
Sergio A. Velastin,
Paolo Remagnino,
Tim Ellis:
Human action recognition using robust power spectrum features.
ICIP 2008: 753-756 |
28 | EE | Matthew P. Dickens,
William A. P. Smith,
Hossein Ragheb,
Edwin R. Hancock:
Measuring skin reflectance parameters.
ICPR 2008: 1-4 |
27 | EE | Hossein Ragheb,
Sergio A. Velastin,
Paolo Remagnino,
Tim Ellis:
ViHASi: virtual human action silhouette data for the performance evaluation of silhouette-based action recognition methods.
VNBA 2008: 77-84 |
26 | EE | Hossein Ragheb,
Edwin R. Hancock:
A Light Scattering Model for Layered Dielectrics with Rough Surface Boundaries.
International Journal of Computer Vision 79(2): 179-207 (2008) |
2007 |
25 | EE | Hossein Ragheb,
Edwin R. Hancock:
The modified Beckmann-Kirchhoff scattering theory for rough surface analysis.
Pattern Recognition 40(7): 2004-2020 (2007) |
2006 |
24 | EE | Hossein Ragheb,
Edwin R. Hancock:
Reflectance Modeling for Layered Dielectrics with Rough Surface Boundaries.
3DPVT 2006: 302-309 |
23 | EE | Hossein Ragheb,
Edwin R. Hancock:
A Light Scattering Model for Layered Rough Surfaces.
ICIAR (2) 2006: 169-180 |
22 | EE | Hossein Ragheb,
Edwin R. Hancock:
Reflectance from Surfaces with Layers of Variable Roughness.
ICPR (1) 2006: 543-546 |
21 | EE | Hossein Ragheb,
Edwin R. Hancock:
Testing new variants of the Beckmann-Kirchhoff model against radiance data.
Computer Vision and Image Understanding 102(2): 145-168 (2006) |
2005 |
20 | EE | Hossein Ragheb,
Edwin R. Hancock:
Incorporating subsurface attenuation into the Beckmann model.
ICIP (2) 2005: 450-453 |
19 | EE | Hossein Ragheb,
Edwin R. Hancock:
Adding Subsurface Attenuation to the Beckmann-Kirchhoff Theory.
IbPRIA (2) 2005: 247-254 |
18 | EE | Hossein Ragheb,
Edwin R. Hancock:
Surface radiance correction for shape from shading.
Pattern Recognition 38(10): 1574-1595 (2005) |
2004 |
17 | EE | Hossein Ragheb,
Edwin R. Hancock:
Surface Normals and Height from Non-Lambertian Image Data.
3DPVT 2004: 18-25 |
16 | EE | Hossein Ragheb,
Antonio Robles-Kelly,
Edwin R. Hancock:
Testing Reflectance Models Against Radiance Data.
3DPVT 2004: 880-887 |
15 | | Hossein Ragheb,
Edwin R. Hancock:
Surface radiance empirical data against model predictions.
ICIP 2004: 2689-2692 |
2003 |
14 | EE | Hossein Ragheb,
Edwin R. Hancock:
Rough Surface Correction and Re-illumination Using the Modified Beckmann Model.
CAIP 2003: 98-106 |
13 | EE | Hossein Ragheb,
Edwin R. Hancock:
Estimating Surface Characteristics using Physical Reflectance Models.
CVPR (2) 2003: 177-184 |
12 | EE | Hossein Ragheb,
Edwin R. Hancock:
Improving shape recovery by estimating properties of slightly-rough surfaces.
ICIAP 2003: 32-37 |
11 | EE | Hossein Ragheb,
Edwin R. Hancock:
Rough Surface Estimation Using the Kirchhoff Model.
SCIA 2003: 477-484 |
10 | EE | Hossein Ragheb,
Edwin R. Hancock:
A probabilistic framework for specular shape-from-shading.
Pattern Recognition 36(2): 407-427 (2003) |
9 | EE | Hossein Ragheb,
Edwin R. Hancock:
Darboux smoothing for shape-from-shading.
Pattern Recognition Letters 24(1-3): 579-595 (2003) |
2002 |
8 | EE | Hossein Ragheb,
Edwin R. Hancock:
Highlight Removal Using Shape-from-Shading.
ECCV (2) 2002: 626-641 |
7 | | Hossein Ragheb,
Edwin R. Hancock:
Lambertian reflectance correction for rough and shiny surfaces.
ICIP (2) 2002: 553-556 |
6 | | Hossein Ragheb,
Edwin R. Hancock:
Shape-from-shading using viewpoint-invariant principal curvatures.
ICIP (2) 2002: 577-580 |
5 | EE | Hossein Ragheb,
Edwin R. Hancock:
A Probabilistic Framework for Specular Shape-from-Shading.
ICPR (3) 2002: 513-516 |
4 | EE | Hossein Ragheb,
Edwin R. Hancock:
Shape-from-Shading for Highlighted Surfaces.
SSPR/SPR 2002: 576-586 |
2001 |
3 | EE | Hossein Ragheb,
Edwin R. Hancock:
Separating Lambertian and Specular Reflectance Components using Iterated Conditional Modes.
BMVC 2001 |
2 | EE | Hossein Ragheb,
Edwin R. Hancock:
Shape-from-Shading Using Darboux Smoothing.
CAIP 2001: 657-667 |
1 | EE | Hossein Ragheb,
Edwin R. Hancock:
Improved shape-from-shading using Darboux smoothing.
ICIP (2) 2001: 817-820 |