| 2008 |
|---|
| 4 | EE | Richard Putman:
Using reiterative LFSR based X-masking to increase output compression in presence of unknowns.
ACM Great Lakes Symposium on VLSI 2008: 355-358 |
| 3 | EE | Ritesh Garg,
Richard Putman,
Nur A. Touba:
Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation.
VTS 2008: 35-42 |
| 2007 |
|---|
| 2 | EE | Richard Putman,
Nur A. Touba:
Using Multiple Expansion Ratios and Dependency Analysis to Improve Test Compression.
VTS 2007: 211-218 |
| 2006 |
|---|
| 1 | EE | Richard Putman,
Rahul Gawde:
Enhanced Timing-Based Transition Delay Testing for Small Delay Defects.
VTS 2006: 336-342 |
