A. Pergoot

2001
1	EE	R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken: A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectronics Reliability 41(3): 437-443 (2001)

Coauthor Index

1	Ward De Ceuninck	[1]
2	K. Croes	[1]
3	R. Dreesen	[1]
4	Guido Groeseneken	[1]
5	J. Manca	[1]
6	Luc De Schepper	[1]